This work is funded by the European Commission, education and training: LLP Transversal Programme KA3-ICT through Project 511787-LLP-1-2010-1-TR-KA3-KA3MP
A very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit; also called scanning force microscopy (SFM).